ํ๊ตญ์ด 
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HS ์๋ฆฌ์ฆ
์ ํ ์ฃผ์ ๋ด์ฉ
| ์ ๋ ฅ ์ ์ | -5~10V |
| ์ต๋ ์ ์ | 0.001~10V |
| ์ฑ๋ ๋ฒํธ | 4~32 |
High-Speed Pulse Testing with Arbinโs HSP Systems
Capable of 100 ฮผS pulses, our HSP testers are designed for applications requiring high-speed, multi-stage pulse testing. These systems allow you to run independent pulse and simulation profiles on each channel simultaneously. Arbinโs HSP series features a minimum pulse width of 100 ฮผS, a rise time as fast as 10 ฮผS, and simultaneous pulse generation and data logging. For custom needs, the HSP systems also allow for user-defined pulse profiles with 2-30 stages.
Simulate Pulse Profiles for a Range of Applications
Arbinโs HSP series is able to simulate pulse profiles for telecom applications, including GSM, CDMA, iDEN, GPRS, and others. These testing systems are able to perform custom-defined pulse profiles as required for medical devices, power tools, consumer electronics, and additional applications requiring multi-stage pulse testing. The HSP testers are suitable for conducting testing protocols that include UL1642, UN38.3, MOTO, Apple, IEC62133, GB/T 18287-2000, and more.
์ง๊ธ ๋ฐ๋ก ๊ฒฌ์ ๋ฌธ์
๋ฌธ์ ์์์ ์์ฑํ์ฌ ๊ฒฌ์ ์ ์์ฒญํ๊ฑฐ๋ ์๋น ์ธ์คํธ๋ฃจ๋จผํธ์ ๋ฐฐํฐ๋ฆฌ ํ ์คํธ ์ฅ๋น๊ฐ ๊ท์ฌ์ ํ ์คํธ ์๊ตฌ ์ฌํญ์ ์ด๋ป๊ฒ ์ถฉ์กฑํ๋์ง ์์๋ณด์ธ์.